High-performance vacuum equipment customizable to meet customer needs.
Achieved high vacuum levels by inheriting the technology of MECA2000, which was well-regarded for its high vacuum devices.
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basic information
A vacuum deposition device is a device used in the thin film formation process of semiconductor manufacturing, with various types of deposition equipment such as PVD, CVD, PLD, and MBE existing depending on the method. The level of vacuum is a significant factor determining the quality of semiconductors. At Seika Digital Image, we have been handling products from VINCI, a company renowned for its long-standing thin film material evaluation equipment, and we have now added their vacuum deposition devices to our lineup. VINCI has incorporated MECA2000, a company known for its high vacuum equipment, and provides various deposition devices (PVD, CVD, PLD, MBE), with many delivery records primarily in Europe. This equipment is optimal for the processes involved in producing semiconductor devices used in lasers and LEDs.
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Applications/Examples of results
Various semiconductors Displays (organic EL devices, etc.) Sensors Thin-film solar cells Aerospace devices Optical devices Various coatings (hardening treatment, decorative treatment)
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Company information
We are waiting for your inquiries and consultations regarding our products and services, such as the following: ■ Particle Size Distribution and Powder Measurement - I want to replace my particle size analyzer, but it's too expensive to implement. - I want to introduce an easy-to-operate particle size analyzer. - I want to measure particle size distribution in the nano range at a low cost. ■ Fluid Measurement and Visualization - Concerns about the visualization and quantification of fluids. - I introduced PIV software, but I can't measure effectively. - I want to simultaneously measure the flow velocity and particle size of spray particles. ■ Strain and Displacement Measurement - I want to measure strain in areas where strain gauges cannot be attached. - I want to analyze strain and displacement non-contactly. - I want to measure the distribution of strain over a surface. ■ Thin Film and Porous Material Evaluation - I would like to consult about mercury porosimeters that will no longer be usable due to the Minamata Convention. - I want to evaluate the gas diffusion performance of GDL and MEA in fuel cells. - I want to measure the permeability of barrier films at high speed. We welcome any inquiries, no matter how trivial, so please feel free to consult with us. We also have a lab room available for demonstrations and product tours.