Presentation of technical data: Publication on the vertical resolution of signal processing devices.
This document is a technical report explaining the vertical resolution of signal processing devices. In a heterodyne processing system, the presence or absence of vertical resolution in the signal processing device was verified in real mode using a synthesizer. When the frequency difference between the two signals was more than 1 mHz, the resolution obtained was as theoretical. Particularly, during a 5-minute measurement in real mode, the resolution was below 1 nm, and this resolution was maintained even in repeated measurements. Similar results were obtained using three types of synthesizers, confirming the characteristics of the signal processing device. [Contents] ■ About the signal processing device ■ About the signal processing software ■ Theory regarding frequency differences ■ Experiments regarding frequency differences ■ Reflection and discussion *For more details, please refer to the PDF document or feel free to contact us.
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We have established 'High-precision measurement of physical quantities using light' as our management policy. Optical measurement technology has become an indispensable element of modern cutting-edge technology. We are confident that the demand for high-precision measurement will grow stronger with the advancement of science. By combining high-precision measurement with the excellent properties of light—non-invasive, non-intrusive, non-contact, and high-precision—we can expect further technological innovation. It may not be suitable for measuring mass-produced items, nor for online measurements. However, we are committed to making it useful for cutting-edge industries that require high-precision measurement of physical quantities.
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