iPROS Manufacturing
  • Search for products by classification category

    • Electronic Components and Modules
      Electronic Components and Modules
      56058items
    • Machinery Parts
      Machinery Parts
      70951items
    • Manufacturing and processing machinery
      Manufacturing and processing machinery
      95586items
    • Scientific and Physics Equipment
      Scientific and Physics Equipment
      33078items
    • Materials
      Materials
      34937items
    • Measurement and Analysis
      Measurement and Analysis
      52813items
    • Image Processing
      Image Processing
      14579items
    • Control and Electrical Equipment
      Control and Electrical Equipment
      50370items
    • Tools, consumables, and supplies
      Tools, consumables, and supplies
      62940items
    • Design and production support
      Design and production support
      11729items
    • IT/Network
      IT/Network
      40511items
    • Office
      Office
      13186items
    • Business support services
      Business support services
      32019items
    • Seminars and Skill Development
      Seminars and Skill Development
      5707items
    • Pharmaceutical and food related
      Pharmaceutical and food related
      23652items
    • others
      59639items
  • Search for companies by industry

    • Manufacturing and processing contract
      7354
    • others
      5041
    • Industrial Machinery
      4430
    • Machine elements and parts
      3292
    • Other manufacturing
      2872
    • IT/Telecommunications
      2520
    • Trading company/Wholesale
      2454
    • Industrial Electrical Equipment
      2316
    • Building materials, supplies and fixtures
      1818
    • software
      1648
    • Electronic Components and Semiconductors
      1576
    • Resin/Plastic
      1493
    • Service Industry
      1409
    • Testing, Analysis and Measurement
      1131
    • Ferrous/Non-ferrous metals
      980
    • environment
      702
    • Chemical
      630
    • Automobiles and Transportation Equipment
      558
    • Printing Industry
      506
    • Information and Communications
      434
    • Consumer Electronics
      422
    • Energy
      321
    • Rubber products
      311
    • Food Machinery
      303
    • Optical Instruments
      282
    • robot
      275
    • fiber
      250
    • Paper and pulp
      232
    • Electricity, Gas and Water Industry
      172
    • Pharmaceuticals and Biotechnology
      166
    • Warehousing and transport related industries
      145
    • Glass and clay products
      142
    • Food and Beverage
      134
    • CAD/CAM
      122
    • retail
      110
    • Educational and Research Institutions
      107
    • Medical Devices
      101
    • Ceramics
      96
    • wood
      87
    • Transportation
      83
    • Petroleum and coal products
      61
    • Medical and Welfare
      61
    • Shipbuilding and heavy machinery
      52
    • Aviation & Aerospace
      47
    • Fisheries, Agriculture and Forestry
      39
    • self-employed
      23
    • Public interest/special/independent administrative agency
      22
    • equipment
      20
    • Mining
      17
    • Research and development equipment and devices
      17
    • Materials
      16
    • Government
      15
    • Finance, securities and insurance
      13
    • Individual
      10
    • Restaurants and accommodations
      8
    • cosmetics
      8
    • Police, Fire Department, Self-Defense Forces
      7
    • Laboratory Equipment and Consumables
      3
    • Contracted research
      3
    • Raw materials for reagents and chemicals
      2
  • Special Features
  • Ranking

    • Overall Products Ranking
    • Overall Company Ranking
Search for Products
  • Search for products by classification category

  • Electronic Components and Modules
  • Machinery Parts
  • Manufacturing and processing machinery
  • Scientific and Physics Equipment
  • Materials
  • Measurement and Analysis
  • Image Processing
  • Control and Electrical Equipment
  • Tools, consumables, and supplies
  • Design and production support
  • IT/Network
  • Office
  • Business support services
  • Seminars and Skill Development
  • Pharmaceutical and food related
  • others
Search for Companies
  • Search for companies by industry

  • Manufacturing and processing contract
  • others
  • Industrial Machinery
  • Machine elements and parts
  • Other manufacturing
  • IT/Telecommunications
  • Trading company/Wholesale
  • Industrial Electrical Equipment
  • Building materials, supplies and fixtures
  • software
  • Electronic Components and Semiconductors
  • Resin/Plastic
  • Service Industry
  • Testing, Analysis and Measurement
  • Ferrous/Non-ferrous metals
  • environment
  • Chemical
  • Automobiles and Transportation Equipment
  • Printing Industry
  • Information and Communications
  • Consumer Electronics
  • Energy
  • Rubber products
  • Food Machinery
  • Optical Instruments
  • robot
  • fiber
  • Paper and pulp
  • Electricity, Gas and Water Industry
  • Pharmaceuticals and Biotechnology
  • Warehousing and transport related industries
  • Glass and clay products
  • Food and Beverage
  • CAD/CAM
  • retail
  • Educational and Research Institutions
  • Medical Devices
  • Ceramics
  • wood
  • Transportation
  • Petroleum and coal products
  • Medical and Welfare
  • Shipbuilding and heavy machinery
  • Aviation & Aerospace
  • Fisheries, Agriculture and Forestry
  • self-employed
  • Public interest/special/independent administrative agency
  • equipment
  • Mining
  • Research and development equipment and devices
  • Materials
  • Government
  • Finance, securities and insurance
  • Individual
  • Restaurants and accommodations
  • cosmetics
  • Police, Fire Department, Self-Defense Forces
  • Laboratory Equipment and Consumables
  • Contracted research
  • Raw materials for reagents and chemicals
Special Features
Ranking
  • Overall Products Ranking
  • Overall Company Ranking
  • privacy policy
  • terms of service
  • About Us
  • Careers
  • Advertising
  1. Home
  2. ProductSearch
  3. Measurement and Analysis
  4. Analytical Instruments
  5. Analytical Equipment and Devices
  6. Total support service for cross-sectional grinding, processing, observation, and analysis.

Total support service for cross-sectional grinding, processing, observation, and analysis.

  • Added to bookmarks

    Bookmarks list

    Bookmark has been removed

    Bookmarks list

    You can't add any more bookmarks

    By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

    Free membership registration

last updated:Jun 26, 2025

アイテス
アイテス
  • Special site
  • Official site

We undertake contract processing and manufacturing of cross-sections of various parts and materials.

At Aites, we undertake contract processing of cross-sections of various components and materials, including electronic components, mounted circuit boards, semiconductors, compound semiconductors, power devices, films, resin molded products, solar panels, and LCD glass. We also conduct observation and analysis of the produced cross-sections, providing contract analysis for defect analysis and quality evaluation. 【Service List】 ■Mechanical polishing ■CP processing ■Microtome ■FIB processing ■Analysis of semiconductor diffusion layers, etc. *For more details, please refer to the PDF document or feel free to contact us.

    Analytical Equipment and DevicesAnalysis Services
image.png

Total support service for cross-sectional grinding, processing, observation, and analysis.

image.png
image.png
  • Related Link - https://www.ites.co.jp
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

Inquire About This Product

  • Contact Us Online
  • Download catalog

basic information

For more details, please refer to the PDF document or feel free to contact us.

Price range

Please contact us for details

Delivery Time

Please contact us for details

Applications/Examples of results

For more details, please refer to the PDF document or feel free to contact us.

catalog(69)

Download All Catalogs
Total support service for cross-section grinding, processing, observation, and analysis.

Total support service for cross-section grinding, processing, observation, and analysis.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] Whisker Analysis by EBSD

[Data] Whisker Analysis by EBSD

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] Structural Analysis of MEMS Components

[Data] Structural Analysis of MEMS Components

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Observation of diamond clarity

Observation of diamond clarity

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Oblique CT observation of the laminated substrate

Oblique CT observation of the laminated substrate

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Measurement of solder crack rate by cross-sectional observation.

Measurement of solder crack rate by cross-sectional observation.

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Example of EPMA analysis using the guide network map method.

Example of EPMA analysis using the guide network map method.

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

The microtome's blade (knife) is its lifeline.

The microtome's blade (knife) is its lifeline.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

[Information] Differentiating Between Optical Microscopes and SEM

[Information] Differentiating Between Optical Microscopes and SEM

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Surface observation of IC chips implemented on LCD panels.

Surface observation of IC chips implemented on LCD panels.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Analysis case of faulty switch contacts

Analysis case of faulty switch contacts

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Optical film light transmission characteristics

Optical film light transmission characteristics

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Observation of CMOS image sensor cross-section by mechanical polishing.

Observation of CMOS image sensor cross-section by mechanical polishing.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Analysis of electronic components and materials using TEM.

Analysis of electronic components and materials using TEM.

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Material evaluation using a ultra-micro hardness tester.

Material evaluation using a ultra-micro hardness tester.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Observation of the coating film

Observation of the coating film

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Energy Dispersive X-ray Spectroscopy (EDS)

Energy Dispersive X-ray Spectroscopy (EDS)

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

[Analysis case by EDS] Bonding interface of Cu pad

[Analysis case by EDS] Bonding interface of Cu pad

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-sectional observation of substrate-mounted components.

Cross-sectional observation of substrate-mounted components.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-sectional observation of substrate-mounted components (1) to (6)

Cross-sectional observation of substrate-mounted components (1) to (6)

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

CP processing device Arblade5000_ Wide Area Cross-section Milling

CP processing device Arblade5000_ Wide Area Cross-section Milling

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Example of analysis of compounds at the interface between SAC solder and Ni pads.

Example of analysis of compounds at the interface between SAC solder and Ni pads.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

[Case Study] X-ray Fluoroscopy and CT Examination Equipment

[Case Study] X-ray Fluoroscopy and CT Examination Equipment

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Sectioning using a microtome

Sectioning using a microtome

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Differences in appearance due to SEM observation conditions.

Differences in appearance due to SEM observation conditions.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

3D construction through mechanical grinding

3D construction through mechanical grinding

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Introduction to Section Processing and Observation Methods

Introduction to Section Processing and Observation Methods

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

MLCC crack X-ray observation

MLCC crack X-ray observation

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-section polishing (CP) method for cross-sectional observation service.

Cross-section polishing (CP) method for cross-sectional observation service.

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

EPMA analysis

EPMA analysis

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Regarding the curing temperature of epoxy resin during sample encapsulation.

Regarding the curing temperature of epoxy resin during sample encapsulation.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Authenticity investigation (comparative observation)

Authenticity investigation (comparative observation)

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Examples of semiconductor observation through mechanical polishing.

Examples of semiconductor observation through mechanical polishing.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

X-ray fluoroscopy and CT scanner 'Cheetah EVO'

X-ray fluoroscopy and CT scanner 'Cheetah EVO'

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

X-ray fluoroscopy and CT examination device: Case study of BGA solder crack analysis

X-ray fluoroscopy and CT examination device: Case study of BGA solder crack analysis

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.

[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Observation of metallic tissue through chemical treatment.

Observation of metallic tissue through chemical treatment.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

The nature of analysis techniques, including defect analysis of joints, adhesion, and assembly parts.

The nature of analysis techniques, including defect analysis of joints, adhesion, and assembly parts.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Whisker evaluation

Whisker evaluation

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

[Information] Whisker Observation - Tips for Observing Flat Whiskers

[Information] Whisker Observation - Tips for Observing Flat Whiskers

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] EPMA Analysis Example 2

[Data] EPMA Analysis Example 2

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Analysis of the assembly joints of the implemented components

Analysis of the assembly joints of the implemented components

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Surface mount electronic component cross-sectional observation service

Surface mount electronic component cross-sectional observation service

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (Scanning Electron Microscope)

[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (Scanning Electron Microscope)

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Observation of aluminum welding joints

Observation of aluminum welding joints

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-sectional observation of large samples (expansion valve)

Cross-sectional observation of large samples (expansion valve)

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Changes due to differences in acceleration voltage during EDX analysis.

Changes due to differences in acceleration voltage during EDX analysis.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Basic Analysis Methods for Things that are Similar yet Different

Basic Analysis Methods for Things that are Similar yet Different

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Ultrasonic Microscope 'SAM'

Ultrasonic Microscope 'SAM'

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] Cross-sectional observation of solar cell modules

[Data] Cross-sectional observation of solar cell modules

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Seven spectral crystals in EPMA analysis

Seven spectral crystals in EPMA analysis

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

[Data] Example of EPMA Analysis

[Data] Example of EPMA Analysis

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Evaluation of BGA/CSP solder

Evaluation of BGA/CSP solder

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-sectional polishing service for implementation parts and electronic components.

Cross-sectional polishing service for implementation parts and electronic components.

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

X-ray observation of electrolytic capacitors

X-ray observation of electrolytic capacitors

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Cross beam FIB cross-sectional observation

Cross beam FIB cross-sectional observation

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Crystal analysis by EBSD: Intermetallic compounds in solder joints

Crystal analysis by EBSD: Intermetallic compounds in solder joints

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

[Dataset] LCD Panel Analysis Dataset

[Dataset] LCD Panel Analysis Dataset

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Crystal analysis by EBSD BGA

Crystal analysis by EBSD BGA

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

[Information] Regarding the bonding interface of Cu wire bonding.

[Information] Regarding the bonding interface of Cu wire bonding.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Cross-sectional observation by SEM: Connector plating

Cross-sectional observation by SEM: Connector plating

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Appearance observation and measurement services

Appearance observation and measurement services

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Observation of tracking camera cross-section by mechanical polishing.

Observation of tracking camera cross-section by mechanical polishing.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

About the curing temperature of epoxy resin free of hazardous substances.

About the curing temperature of epoxy resin free of hazardous substances.

OTHER
  • E-book viewing
  • Catalog download

Contact this catalog

Cryogenic ion milling cross-section processing example (rubber products)

Cryogenic ion milling cross-section processing example (rubber products)

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Effects of heat generated during cross-sectional ion milling (CP) processing.

Effects of heat generated during cross-sectional ion milling (CP) processing.

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

Example of failure analysis of chip resistors

Example of failure analysis of chip resistors

TECHNICAL
  • E-book viewing
  • Catalog download

Contact this catalog

News about this product(13)

Cryogenic ion milling cross-section processing example (rubber products)

  • Product news

We will introduce a case where cross-sections were created and observed by method regarding the adhesive parts of the tires of pull-back cars. When conducting SEM observations of the created cross-sections, fillers present inside the rubber were confirmed. It was found that the dispersion state of the fillers and the condition of the adhesive interface were not clear with fracture by liquid nitrogen or mechanical polishing. In contrast, the cross-sections created by cryo ion milling allow for clear observation of the dispersion state of the fillers contained within the rubber and the condition of the adhesive interface with the plastic substrate.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

About the curing temperature of epoxy resin free from hazardous substances.

  • Product news

We conducted measurements to reconfirm the temperature of heat generation during curing, following the change to a non-toxic epoxy resin. When using a large amount of resin, we apply heat generation prevention treatment for resin embedding. Without this treatment, the temperature can rise up to 138°C during curing. However, by applying the heat generation prevention treatment even with a large amount of resin, we were able to keep the heat generation during curing within 30°C.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Observation of tracking camera cross-section by mechanical grinding.

  • Product news

I would like to introduce "Cross-sectional observation of tracking camera using mechanical polishing." Regarding the structure of the tracking camera components, when viewed from above, the lens can be identified. Although it cannot be clearly seen in the X-ray image, the lens is incorporated into the convex part. Additionally, the cross-sectional structure is similar to that of an RGB sensor, featuring a back-illuminated CMOS structure. However, since color information is not necessary for the tracking camera, there is no color filter layer. A jagged uneven shape was observed on the surface of the photodiode.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Appearance observation and measurement services

  • Product news

We would like to introduce our "Appearance Observation and Measurement Service." We are equipped with a variety of devices to meet your needs, including appearance observation before and after reliability testing, solder joint observation, as well as dimensional measurements and surface roughness measurements of various components. You can also leave the pre-observation processing to us. Our company has IPC-certified IPC specialists on staff. We provide assistance with observations, consultations, and solutions to various observation-related concerns in accordance with international standards.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Companynews list (96)

Company information

アイテス

アイテス

Electronic Components and Semiconductors

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
  • Special site
  • Official site
Phone number/address

Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

Product/Service List (351)

The related categories of Analytical Equipment and Devices

  • Measurement and Analysis
  • Analytical Instruments
  • Analytical Equipment and Devices
  • Design and production support
  • CAE
  • Analysis Services
          

Inquire About This Product

  • Contact Us Online
  • Download catalog

Products

  • Search for Products

Company

  • Search for Companies

Special Features

  • Special Features

Ranking

  • Overall Products Ranking
  • Overall Company Ranking

support

  • site map
IPROS
  • privacy policy Regarding external transmission of information
  • terms of service
  • About Us
  • Careers
  • Advertising
COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.
Please note that the English text on this page is automatically translated and may contain inaccuracies.