3D Confocal Laser Raman Microscope Confotec NR500
3D Confocal Laser Raman Microscope Confotec NR500
High-end model: A top-level micro-Raman spectrometer with high sensitivity, high wavenumber resolution, and high expandability.
【Features】 - High spatial resolution: XY < 300 nm, Z < 600 nm (@532 nm) - High frequency resolution - High-speed imaging mode: Galvano scan 1000x1000 pixels/3 seconds - Automation features: Laser output, beam diameter, pinhole size, grating switching, etc. - High expandability: CARS model, AFM Raman/TERS, fluorescence lifetime measurement, autofocus function, SERS substrates, etc. - Low-frequency Raman measurement option - Brillouin scattering measurement option The device, equipped with a series of optical configurations such as a confocal pinhole, can automatically switch between them, enabling spectral analysis of micro-particles or Raman imaging of macro objects with high spatial resolution. It is a Raman microscope with a rich array of additional options and excellent expandability.
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basic information
The device, equipped with a confocal optical configuration, allows for the automatic switching of a series of optical setups such as confocal pinholes, enabling spectral analysis of micro-particles or Raman imaging of macro objects with high spatial resolution. It is a Raman microscope with rich additional options and excellent expandability. The specially designed imaging spectrometer incorporates many features ideal for confocal Raman measurements. The pinhole image is projected onto a multi-channel detector without aberration. It supports high-speed imaging modes using PMT or EMCCD, significantly improving Raman detection efficiency and speed. Wavelength calibration can also be performed automatically using the built-in Ne lamp as a light source (optional).
Price information
The price varies depending on the device configuration. Please contact us.
Delivery Time
※The delivery date will vary depending on the device configuration. Please contact us.
Applications/Examples of results
【Applications】 - Identification and analysis of submicron-sized foreign particles - Structural analysis and quality evaluation of carbon materials (such as DLC films, graphene, carbon nanotubes, etc.) - Structural analysis and quality evaluation of solar cell materials and lithium-ion battery materials - Characterization of superconducting materials - Evaluation of polymer materials - Measurement of layer structure in organic films - Component analysis and material analysis - Quality evaluation of chemicals/drugs and measurement of component distribution - Forensic science and scientific investigation - Appraisal of antiques and gemstones - Geological research and mineral property evaluation - Biological research (cells, tissues) and more.
Detailed information
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High throughput The fourth band of silicon at 1940 cm-1 can be observed within one minute even with a low-power laser. 2D/3D images can also be obtained quickly.
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Excellent imaging resolution. Spectral image of a pinhole on a CCD camera. No aberrations.
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Depth resolution Depth resolution of 450nm (at λ=488nm, 100x, NA=0.95)
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Low-frequency Raman option Low-frequency Raman band of cadmium iodide (< 200 cm-1, 633 nm laser). Can be extended by using ultra-narrow band notch filters.
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Company information
MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.
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