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  6. Research and development multi-range spectrometer "INVENIO X"

Research and development multi-range spectrometer "INVENIO X"

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last updated:Dec 02, 2024

ブルカージャパン オプティクス事業部
ブルカージャパン オプティクス事業部
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Complete the next-generation INVENIO platform and establish a new standard for FT-IR in advanced research and development.

The "INVENIO X" completes the next-generation INVENIO platform and establishes a new standard for advanced research and development FT-IR. By using the "DigiTect" detector in conjunction with the "Transit" second sample chamber, it is possible to simultaneously mount up to seven detectors, each of which can be freely controlled from the software. This allows for coverage of a wide range from far infrared to visible/ultraviolet. 【Features】 ■ Newly designed INTEGRAL interferometer ■ Innovative MultiTect technology supporting five detectors ■ User-replaceable DigiTect detector slots ■ Dedicated detector mounting, simple transmission/reflection measurement Transit channel second sample chamber ■ 24-bit dynamic range, dual-channel ADC, full digital signal processing *For more details, please refer to the PDF materials or feel free to contact us.

    Analytical Equipment and Devices
2020-01-09_16h58_29.png

Research and development multi-range spectrometer "INVENIO X"

2020-01-09_16h58_29.png
2020-01-09_16h58_29.png
  • Related Link - https://www.bruker.com/jp/products/infrared-near-i…

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【Other Features】 ■ Expansion to far infrared, near infrared, visible / ultraviolet regions, field upgrade compatible ■ Fully automated multispectral measurement from far infrared to visible/ultraviolet regions using INTEGRAL interferometer and MultiTect technology ■ OPUS software supporting advanced measurement and analysis ■ OPUS-TOUCH R&D software/touch panel PC option for a more comfortable operating environment ■ Software-controlled optical input/output ports (output X3, input X2) ■ Rapid, slow, and step scan options enabling various modulation measurements and time-resolved measurements ■ Complete compatibility with all accessories and expansion modules for VERTEX and INVENIO ■ Sample chamber bypass/direct emission optical path option ■ Easily operable and detachable sample chamber cover (customizable) ■ Dry sealed optical bench (purgeable) ■ Sophisticated system status display with LED light bar *For more details, please refer to the PDF document or feel free to contact us.

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Research and development multi-range spectrometer "INVENIO X"

Research and development multi-range spectrometer "INVENIO X"

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Technical Document: "FT-IR in Academic Research"

Technical Document: "FT-IR in Academic Research"

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ブルカージャパン

ブルカージャパン オプティクス事業部

Testing, Analysis and Measurement

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The optics business started in 1960 as the infrared spectroscopy division of the Bruker Group in Germany. The range of products developed based on high design philosophy varies from dedicated machines used daily for production management and quality assurance to research models that demonstrate their power in the research and development of advanced materials. With Ettlingen, Germany, as the base for development and manufacturing, we respond to various customer needs through a global sales and service network.

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