This is an infrared refractometer suitable for measuring the refractive index of infrared windows, infrared lenses, and chalcogenide glass!
The "NRI Series" is a device that measures the refractive index of a sample by irradiating it with monochromatic light of arbitrary wavelengths (1 to 14 μm) based on the minimum angle method and measuring the angle of transmitted light relative to the incident light. It can measure a refractive index accuracy of 0.0001, which cannot be obtained by conventional measurement methods. It is suitable for evaluating Ge, Si, ZnSe, KRS-5, chalcogenide glass, and infrared optical thin films used in infrared windows and lenses. 【Features】 ■ High-precision measurement of refractive index (0.0001) in the wavelength range of 1 to 14 μm ■ Equipped with temperature control functionality, allowing measurement of refractive index variations due to temperature changes *For more details, please refer to the PDF document or feel free to contact us.
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【Specifications (Excerpt)】 ■ Measurement Method: Minimum Deviation Method (Fresnel Method) ■ Measurement Items: Refractive Index, Apex Angle ・Change in Refractive Index with Wavelength (dn/dλ) ・Change in Refractive Index with Sample Temperature (dn/dT) ■ Measurement Refractive Index Range: 1 to 4 ■ Measurement Accuracy: 0.0001 (1×10^-4) ■ Measurement Wavelength Range: 1 to 14μm ■ Irradiation Wavelength Range: 400nm to 20μm *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Our company was established in September 1977 as a subsidiary of Japan Spectroscopy Co., Ltd., primarily targeting the research and development departments of universities, government agencies, and corporations. Our goal is to manufacture spectroscopic and optical measurement instruments that faithfully meet customer demands. To date, we have produced numerous unique devices, including solar cell evaluation systems (spectral sensitivity measurement for silicon and dye-sensitized solar cells), spectral response measurement systems (pricing for silicon photodiodes and radiation thermometers), optical element measurement systems (transmission and reflection measurement for lenses and prisms), monochromatic light irradiation systems, and vacuum ultraviolet spectrophotometers.
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