Ideal for large-scale work! Simultaneous observation of measurement images and color CCD images without switching the light source is possible.
The "RPI-P" is a roll pattern measurement device that allows for easy high-resolution and high-definition measurements by being installed on a roll. By adopting a DMD (Digital Micromirror Device) for laser scanning, it enables high-speed and wide-angle scanning measurements. Additionally, with a confocal optical system, it can acquire three-dimensional shapes and images that are in focus at all points without contact. 【Features】 ■ Easy high-resolution and high-definition measurements ■ Adoption of DMD (Digital Micromirror Device) for laser scanning ■ Enables high-speed and wide-angle scanning measurements ■ Can acquire three-dimensional shapes and images in focus at all points without contact ■ Simultaneous observation of measurement images and color CCD images without switching the light source *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Measurement Target Examples】 ■ Rolls such as gravure rolls, transfer rolls, and embossing rolls ■ Large workpieces that cannot be transported *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Purpose】 ■ Measurement of the opening area and volume of roll surface patterns ■ Measurement of scratches, unevenness height, depth, and shape on the roll surface *For more details, please refer to the PDF document or feel free to contact us.
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At Okura Industry Co., Ltd., in addition to wafer edge profile measurement devices, we design, manufacture, and sell optical and mechatronic equipment such as laser microscopes. We can provide custom solutions for automatic inspection devices and observation evaluation devices that utilize microscopes, flexibly accommodating optimal wavelengths, fields of view, inspection methods, and software for inspections.
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