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  6. TMA (Thermomechanical Analysis)

TMA (Thermomechanical Analysis)

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last updated:Jun 26, 2025

アイテス
アイテス
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Information on thermal expansion, thermal contraction, and glass transition temperature can be obtained in multiple measurement modes!

TMA (Thermomechanical Analysis) is a method that measures the dimensional changes of a sample while applying a constant load and varying the sample temperature. It provides information on thermal expansion, thermal contraction, glass transition temperature, and more. The temperature range is from -150 to 1000°C, with a maximum size of Φ10×25mm (compression mode, needle insertion mode) and a maximum size of 0.7mm×5mm×20mm (tensile mode) as measurable conditions. This document includes case studies of TMA analysis for semiconductor encapsulants. 【Features】 ■ Thermomechanical measurement ■ Applying a constant load to the sample while varying the sample temperature ■ Measuring the dimensional changes of the sample ■ Obtaining information on thermal expansion, thermal contraction, glass transition temperature, etc. ■ Multiple measurement modes *For more details, please refer to the PDF document or feel free to contact us.

    Contract AnalysisContract measurementContract Inspection
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TMA (Thermomechanical Analysis)

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  • Related Link - https://www.ites.co.jp/
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basic information

[Analyzable Sample Forms] ■ Block-shaped (self-supporting) with parallel top and bottom ■ Film or fibrous ■ Block-shaped (self-supporting) *For more details, please refer to the PDF document or feel free to contact us.*

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TMA (Thermomechanical Analysis)

TMA (Thermomechanical Analysis)

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Total support service for chemical analysis

Total support service for chemical analysis

OTHER
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Component Analysis: GC-MS Gas Chromatography Mass Spectrometer

Component Analysis: GC-MS Gas Chromatography Mass Spectrometer

PRODUCT
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TG-DTA (Thermogravimetric Differential Thermal Analysis)

TG-DTA (Thermogravimetric Differential Thermal Analysis)

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DSC (Differential Scanning Calorimetry)

DSC (Differential Scanning Calorimetry)

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DMA (Dynamic Mechanical Analysis)

DMA (Dynamic Mechanical Analysis)

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Analysis of resin materials (for semiconductor LED applications)

Analysis of resin materials (for semiconductor LED applications)

OTHER
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The Flow of Chemical Analysis

The Flow of Chemical Analysis

OTHER
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[Data] FT-IR Analysis of Transparent Resin

[Data] FT-IR Analysis of Transparent Resin

TECHNICAL
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[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

TECHNICAL
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[Data] IR Analysis of Vinyl Polymers (Resin Materials)

[Data] IR Analysis of Vinyl Polymers (Resin Materials)

TECHNICAL
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[Information] We will solve the cause of the issue from a chemical perspective.

[Information] We will solve the cause of the issue from a chemical perspective.

OTHER
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Chemical Analysis Trust Service

Chemical Analysis Trust Service

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Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

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Observation of substrate deformation using a 3D shape measuring device (VR-6200)

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I would like to introduce "Observation of Substrate Deformation Using a 3D Shape Measuring Machine." By applying pressure to the PCB substrate, referencing bending tests of plastics and PCB substrates, the change in state is measured using a 3D shape measuring machine (VR-6200). Since the measurement results can be confirmed with a color palette and line profile, it is possible to visually verify the shape and amount of deformation caused by the applied pressure.

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Chemical Analysis Concierge Service

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We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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