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  3. Measurement and Analysis
  4. Analytical Instruments
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  6. Analysis of multilayer materials using micro-Raman.

Analysis of multilayer materials using micro-Raman.

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last updated:Jun 26, 2025

アイテス
アイテス
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Depth-direction measurements using Raman spectroscopy! Material analysis of each layer is possible from the surface of multilayer films.

Our "Micro Raman Spectrophotometer" employs a confocal optical system, allowing for the adjustment of the focal position in the depth direction, similar to a microscope, enabling material analysis of each layer from the surface of multilayer films. Using the confocal function of the micro Raman spectrophotometer, the focus of the Raman laser light can be varied in the depth direction. Additionally, by continuously changing the focal position, it is possible to obtain spectra continuously in the depth direction. 【Features】 ■ Adoption of a confocal optical system ■ Enables material analysis of each layer from the surface of multilayer films ■ Capable of varying the focus of the Raman laser light in the depth direction ■ Allows for continuous spectral acquisition in the depth direction *For more details, please refer to the PDF document or feel free to contact us.

    Analytical Equipment and DevicesSpectroscopic Analysis EquipmentContract Analysis
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Analysis of multilayer materials using micro-Raman.

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  • Related Link - https://www.ites.co.jp/chemistry/index/component_a…
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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[Analysis Case] ■ The polarizer used in the liquid crystal panel has a structure that sandwiches a layer of polyvinyl alcohol (PVA) with added iodine between layers of triacetyl cellulose (TAC). ■ Continuous measurements of the polarizer in the depth direction using a micro-Raman spectrometer revealed a change from TAC to PVA+I2 to TAC to the adhesive layer as the depth increased. *For more details, please refer to the PDF document or feel free to contact us.

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Analysis of crystallinity in resin materials using micro-Raman spectroscopy.

Analysis of crystallinity in resin materials using micro-Raman spectroscopy.

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Analysis of microscopic foreign substances using imaging FT-IR.

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Analysis of multilayer materials using micro-Raman spectroscopy

Analysis of multilayer materials using micro-Raman spectroscopy

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Would you like to check the degradation of resin using FT-IR analysis?

Would you like to check the degradation of resin using FT-IR analysis?

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[Data] Analysis of Polymer Structural Changes

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We handle everything from reliability testing of materials to chemical analysis.

We handle everything from reliability testing of materials to chemical analysis.

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[Data] FT-IR Analysis of Transparent Resin

[Data] FT-IR Analysis of Transparent Resin

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[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

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[Data] IR Analysis of Vinyl Polymers (Resin Materials)

[Data] IR Analysis of Vinyl Polymers (Resin Materials)

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[Information] We will solve the cause of the issue from a chemical perspective.

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FT-IR analysis of polyethylene

FT-IR analysis of polyethylene

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FT-IR analysis of ABS resin

FT-IR analysis of ABS resin

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Raman analysis of carbon materials

Raman analysis of carbon materials

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Foreign substance analysis and component analysis: Comparison of micro-Raman and FTIR.

Foreign substance analysis and component analysis: Comparison of micro-Raman and FTIR.

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Comparison of Infrared Spectroscopy and Raman Spectroscopy

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Micro FT-IR imaging measurement

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Optical film light transmission characteristics

Optical film light transmission characteristics

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Cryogenic ion milling cross-section processing example (rubber products)

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Cryogenic ion milling cross-section processing example (rubber products)

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We will introduce a case where cross-sections were created and observed by method regarding the adhesive parts of the tires of pull-back cars. When conducting SEM observations of the created cross-sections, fillers present inside the rubber were confirmed. It was found that the dispersion state of the fillers and the condition of the adhesive interface were not clear with fracture by liquid nitrogen or mechanical polishing. In contrast, the cross-sections created by cryo ion milling allow for clear observation of the dispersion state of the fillers contained within the rubber and the condition of the adhesive interface with the plastic substrate.

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Optical film light transmission characteristics

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At Aites Co., Ltd., we conduct "optical film analysis." Optical films used in smartphones and other devices have various functions depending on their structure and materials. We measured the light transmittance of privacy protection films at different angles and combined cross-sectional observation with Raman analysis to investigate the mechanism of function manifestation. By investigating the transmittance characteristics of privacy protection films using angle-variable spectrophotometry, we were able to analyze the mechanism of function manifestation through cross-sectional observation and Raman analysis. At Aites, we provide consistent evaluation and analysis from material properties to the mechanisms of function manifestation.

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Micro FT-IR imaging measurement

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We would like to introduce the "Microscopic FT-IR Imaging Measurement" that we conduct. It allows for the visualization of the distribution of substances as a two-dimensional image within a specified plane. It becomes possible to evaluate changes in the distribution of substances that are difficult to assess with regular point measurements through visual images.

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Chemical Analysis Concierge Service

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We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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