Measurement device for measuring surface roughness in the 1 to 500 μm class! The magnification in the horizontal direction has been increased to 4.5×.
The "HM-90-II-TVC-PR" is an optical sectioning measurement device that allows for easy measurement of surface roughness differences of a few microns in sub-micron units while viewing color TV images. It expands the horizontally magnified ratio, which was considered physically impossible, from 1.4× to 4.5× in one go. It has the remarkable ability to show the cross-sectional images of subtle surface depths and heights significantly shifted in the horizontal direction for enhanced visibility. 【Features】 ■ The cross-sectional shape of the surface roughness is obtained through slit light. ■ It represents minute differences in surface roughness quickly and easily without contact. ■ Suitable for precise non-contact measurement of surface roughness. *For more details, please download the PDF or feel free to contact us.
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【Standard Specifications】 ■Eyepiece: 10× Field of view 1.5mm ■Objective lens: 10× WD6mm ■Total magnification: 100× ■Optical section lateral magnification: 450× ■Reference slit: Two parallel lines ■Projection slit: 10μ half mirror *For more details, please download the PDF or feel free to contact us.
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【Application】 ■ Non-contact measurement of unevenness in metals, rubber, plastics, films, glass, adhesives, printed surfaces, paper, etc. *For more details, please download the PDF or feel free to contact us.
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We handle the entire process in-house, from design to lens polishing, machining, and assembly adjustments, allowing us to quickly and economically produce custom optical devices.
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