Optical system method for measuring insertion loss of ultrafine waveguides.

High-speed and high-precision measurement of insertion loss in microstructured waveguide devices such as silicon photonics waveguides is possible!

The "Optical System Method Ultra-Fine Waveguide Insertion Loss Measurement Device" is an automatic measurement device for insertion loss using our simplified optical measurement system, M-Scope type J. With the optical fiber measurement port and coaxial observation image detector, it allows for direct observation of the core end face images on both the incident and outgoing sides of the waveguide being measured, while simultaneously performing automatic power alignment using optical fibers. By combining coarse alignment through image processing with fine alignment using optical fibers (optical power alignment), it is possible to efficiently measure the insertion loss of ultra-fine waveguides with high speed and high reproducibility. 【Features】 ■ Equipped with our general-purpose polarization-resistant optical measurement system M-Scope type J/PF ■ Insertion loss measurement under conjugate conditions with optical fiber alignment method ■ Dedicated image processing and automatic alignment software provided ■ Combination with an electric positioning stage enables high-speed and highly reproducible automatic measurements through image processing and automatic alignment, among others. *For more details, please download the PDF or feel free to contact us.

Optical Measuring Instruments