Compliant with CISPR 16-1-2, CISPR 25, EN 55025, and MIL-STD-461F standards.
**Product Overview** The TBL0550-1 5µH LISN is a device necessary for setting up conducted noise measurements of electronic equipment powered by DC sources. It is designed to comply with CISPR 16-1-2, CISPR-25, EN55025, MIL-STD-461F, and ISO11452-4, and is intended for measurements in the frequency range of 150kHz to 110MHz, with limited use of DO-160 / ED-14G and ISO7637-2. The LISN is inserted into the supply line of the DUT (Device Under Test). Conducted noise present at the power terminals of the DUT can be measured using a spectrum analyzer or measurement receiver via a BNC connector. The source (power) terminal and the DUT terminal are decoupled by a 5µH inductor. By combining two TBL0550-1 units with the Tekbox LISN Mate, common mode noise and differential mode noise can be measured separately. The unit is equipped with a BNC male to N male RG232 cable, a coupling connector, and a ground bracket for connection to a ground plane.
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【Specifications】 Frequency range: 100 kHz – 150 MHz DC resistance: <9mΩ from source+ to DUT+; <2mΩ from source- to DUT- Maximum current: Continuous 50A, 70A for 3 minutes Nominal operating voltage range: 0 – 60V DC; Component rating: 250V High current plug/screw terminal – Male: Phoenix Contact 1998933, Female: Phoenix Contact 1967375 1µF capacitor can be internally disconnected by removing the jumper Dimensions: 120 mm x 100 mm x 225 mm (270 mm including grounding bracket); Weight: 1.6 kg
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Conducted noise EMC pre-compliance test
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As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly sophisticated electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high levels of safety and reliability. We aim to provide new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
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