Easy operation via the menu! Create high-precision height maps with a special algorithm.
"Mex Ver.5.0" is a 3D view and analysis software for scanning electron microscopes. It allows for direct 3D measurements from SEM and stereo pair images, creating high-precision height maps using a special algorithm. It is equipped with 2D image measurement capabilities and offers various analysis options for profiles, surfaces, and volumes. 【Features】 ■ Direct 3D measurement from SEM and stereo pair images ■ High-precision height map creation using a special algorithm ■ Easy operation through menus ■ Various analysis options (profiles, surfaces, volumes) ■ 2D image measurement capabilities *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
【Other Features】 ■Export images and analysis results ■Standard OS for Windows 2000, XP *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Applications】 ■Cross-sectional structural analysis ■Semiconductor analysis ■Material analysis, research, and development, etc. *For more details, please refer to the PDF document or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Sales of image processing, analysis, and 3D reconstruction software. Additionally, image processing and screen consulting.
![[Analysis Case] Nonlinear Static Magnetic Field Analysis of Magnetic Shielding](https://image.mono.ipros.com/public/product/image/c3f/2000766416/IPROS20683722587076620196.png?w=280&h=280)
