Devices that require operation in high-temperature conditions! Introducing latch-up testing at high temperatures.
We would like to introduce our "High-Temperature Latch-Up Testing." In recent years, there has been an increasing demand for latch-up testing under maximum operating ambient temperature conditions for devices. In particular, for automotive components under AEC standards, the testing conditions are limited to Class II (maximum operating ambient temperature), and for devices that require operation in high-temperature conditions, high-temperature latch-up testing is recommended. 【Main Standards for Latch-Up Testing (Excerpt)】 ■ JEDEC (JESD78E) - Current pulse application method, power supply overvoltage application method - Class I: Room temperature, Class II: Maximum operating ambient temperature ■ JEITA {JEITA ED4701/302 (Test Method 306B)} - Current pulse application method, power supply overvoltage application method - Class I: Room temperature, Class II: Maximum operating temperature *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
【Specifications】 ■Temperature range: 50℃ to 150℃ ■Heating method: Hot air heating (Heating of sockets and devices on the fixture board using a hot air generator) ■Control method: A sensor is installed near the device and controlled by a temperature controller (Temperature sensor: Pt100) As a preliminary check, the surface temperature of the device is measured, and the heater's output value is adjusted ■Testing equipment: ESD/Latch-up tester M7000A-512EL ■Equipment specifications: 4 VCC power supplies (VCC1: 100V/0.5A, VCC2 to VCC4: 50V/1A) The VCC voltage with overvoltage application method and VT pulse voltage can be set up to a maximum of 150V *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（8）
Download All Catalogs
Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
