A lineup that includes a burn-in system that achieves a reduction in initial defects!
We would like to introduce the 'Logic Burn-In Tester' handled by Di-I Japan Co., Ltd. Our lineup includes the high-performance logic burn-in system "DL1100E," as well as the high-temperature and low-temperature operation models "DL1100A" and "DP4100," which achieves high reliability and reduces initial defects. 【Lineup (excerpt)】 ■ DL1100E ■ DL1100A ■ DL800F ■ DL600 ■ DP4100 * You can download the English version of the catalog. * For more details, please refer to the PDF materials or feel free to contact us.
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*You can download the English version of the catalog. *For more details, please refer to the PDF document or feel free to contact us.
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*You can download the English version of the catalog. *For more details, please refer to the PDF document or feel free to contact us.
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At the research institute of our parent company, DI Corporation, we have successfully developed next-generation semiconductor inspection equipment based on specialized research projects related to semiconductor equipment. We maintain and manage a development and manufacturing environment for products that have obtained international certifications for quality (ISO 9001), environment (ISO 14001), information security (ISO 27001), and occupational health and safety (OHSAS 18001). Additionally, to ensure that our customers can use our products with peace of mind, we provide sales and maintenance services utilizing our global network.
