[Application Example] Scan atoms with an integrated micro-cantilever!
The excellent resolution of Atomic Force Microscopy (AFM) is over 1000 times more sensitive than light-based microscopes. Unlike electron microscopes, it can image samples in situ. By combining expertise in mechatronics, MEMS, and low-noise electronic design, we present examples of unique solutions that can reduce the complexity and cost of AFM systems in nanotechnology. *For more details, please refer to the PDF document or feel free to contact us.*
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Electronics Co., Ltd. IMT Division specializes in the individual sales of high-speed digitizers, AWGs (Arbitrary Waveform Generators), and digital I/O from the German company Spectrum, as well as the development and sales of integrated measurement systems and streaming systems using these products. With our extensive knowledge of products and a robust support system, which is possible because we specialize in high-speed digitizers, we propose comprehensive measurement systems that cater to various applications.
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