[Explanatory Material] Reasons why Atfields' data analysis can identify causes of defects.
A must-read for managers and personnel in the technical and quality control departments who want to investigate the causes of quality defects through data analysis!
The occurrence of poor quality is caused by some kind of anomaly in the manufacturing process. Furthermore, that anomaly is reflected in the manufacturing data. Therefore, it is possible to identify the causes of defects through the analysis of manufacturing data. However, simply collecting and analyzing data is not sufficient to identify the causes of defects. It is important to devise a data analysis approach tailored to the purpose. This document introduces the concepts of data analysis approaches necessary for identifying the causes of defects, using Atfields' data analysis approach examples. [Contents] ■ Purpose of this document ■ Assumed issues ■ Examples of data analysis approaches ■ Achievements ■ Service introduction ■ Company overview *For more details, please refer to the PDF document or feel free to contact us.
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Our company is a group of engineers engaged in establishing manufacturing conditions and developing systems necessary for new product development and mass production improvement, primarily in the field of semiconductor manufacturing. We provide consistent support from proposing improvement measures to addressing and following up on issues, by directly confronting phenomena in the field and utilizing statistical methods based on principles and fundamentals. The name of our company, "At Fields," embodies our commitment to contributing to our customers rooted in the field. We promise to be a strong partner in improving our customers' management.
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