Seamless from optical imaging to SEM observation! Elemental analysis while observing simultaneously!
We offer the tabletop electron microscope 'JCM-7000 Neo Scope', which allows for simultaneous elemental analysis during observation. The observation range is from 10x to 100,000x, and all SEM functions can be easily operated. It automatically magnifies from low-magnification optical images to SEM images, allowing for the observation of non-conductive samples as they are. 【Features】 ■ Observation range from 10x to 100,000x ■ All SEM functions are easy to operate ■ Automatic magnification from low-magnification optical images to SEM images - Zeromag - (new feature) ■ Simultaneous elemental analysis during observation - Live Analysis - (new feature) *Optional ■ Standard micro dimension measurement function, among others *For more details, please feel free to contact us.
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【Other Features】 ■ Non-conductive samples can be observed as they are (low vacuum mode) ■ Easy maintenance, filament replacement, and axis adjustment can be easily performed *For more details, please feel free to contact us.
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【Purpose】 ■Observation of shapes and quality control of industrial products such as electronic components, as well as chemicals, paper, wood, insects, and plants. *For more details, please feel free to contact us.*
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Our company is committed to introducing advanced devices and providing them at reasonable prices. We engage in the manufacturing, sales, and purchasing of scientific and industrial machinery. Not only do we sell, but we also promise to provide technical information and support and maintenance after delivery to ensure customer satisfaction. Additionally, for specifications that do not meet your needs with off-the-shelf products, we offer our original products and can accommodate a wide range of custom manufacturing, improvements, and modifications. Please feel free to contact us with any inquiries.
![[Data] Cross-sectional observation of neodymium magnets using a tabletop SEM (scanning electron microscope)](https://image.mono.ipros.com/public/product/image/5fd/2000561894/IPROS71970030245724406256.png?w=280&h=280)
![[Analysis Case] Observation of Heterojunction Interface in CIGS Thin-Film Solar Cells](https://image.mono.ipros.com/public/product/image/eb6/2000026099/IPROS6338370875583078818.jpg?w=280&h=280)
