M2p measurement card capable of generating analog signals, collecting them, and synchronously measuring digital I/O signals!
The need for multi-channel testing is higher than ever. Electronic components, devices, and systems often use array and parallelization technologies to improve performance, leading to increasing complexity. Therefore, performance testing requires more measurements to be conducted simultaneously and at higher speeds. The M2p series provides a convenient solution for creating test systems with dozens or even hundreds of analog and digital channels. We introduce the features for multi-channel testing with the M2p series and its application notes. 【Features】 ■ Synchronized data collection for physical layer signal measurement and protocol layer signal measurement ■ Achieves multi-channel synchronized measurement of analog and digital signals ■ By using SBench6-Pro, it is possible to display analog and digital signals on the same screen in synchronization *For more details, please refer to the PDF document or feel free to contact us.
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Electronics Co., Ltd. IMT Division specializes in the individual sales of high-speed digitizers, AWGs (Arbitrary Waveform Generators), and digital I/O from the German company Spectrum, as well as the development and sales of integrated measurement systems and streaming systems using these products. With our extensive knowledge of products and a robust support system, which is possible because we specialize in high-speed digitizers, we propose comprehensive measurement systems that cater to various applications.
