Focusing on the position and composition of the foreign object! We prepared a cross-section of the foreign object and conducted elemental analysis.
We would like to introduce a case study of foreign matter analysis conducted on laminate film. Upon inspecting the back side of the laminate film, a black foreign object was identified. Therefore, we carried out an investigation to identify the layer of origin and component analysis of this black foreign object. First, we considered the methods based on the objectives of the analysis. This time, we focused on the position of the foreign object and its components, and decided to prepare a cross-section of the foreign object for elemental analysis. 【Case Overview】 ■ A black foreign object was identified upon inspecting the back side of the laminate film. ■ We conducted an investigation to identify the layer of origin and component analysis of the black foreign object. ■ We prepared a cross-section of the foreign object and conducted elemental analysis. *For more details, please refer to the PDF document or feel free to contact us.
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【Analysis Results】 - Observations from cross-section preparation revealed that the foreign substance exists in the adhesive resin layer between the printed film and the non-woven fabric. - Elemental analysis indicated that the foreign substance contains a small amount of oxygen and is primarily composed of carbon. - Considering the color, occurrence location, and composition of the foreign substance, it is suggested that it is a resin carbide. *For more details, please refer to the PDF document or feel free to contact us.*
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For more details, please refer to the PDF document or feel free to contact us.
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![[Data] Cross-section production method](https://image.mono.ipros.com/public/catalog/image/01/cfa/550895/IPROS35597836381814234211.jpeg?w=120&h=170)
![[Data] Measurement of resin molecular weight by high-temperature GPC (SEC)](https://image.mono.ipros.com/public/catalog/image/01/705/663323/IPROS14406842260862890266.jpeg?w=120&h=170)
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.