Standard equipped with Mecha I/F! Enables device operation over USB, allowing control of the main unit with a panel-like interface.
The "FX-210/210L" is a short-open test unit that tests all pins through a unique algorithm, automatically collects data between all pins, and enables stable judgment through a comparison method. It has an ultra-compact size that fits into a 5-inch bay. Utilizing the know-how of circuit board technology for measuring instruments, it has made it possible to standardly equip 128 pins in this size. In the future, Kyoritsu Test Systems plans to continuously develop new lineups based on customer requests. It can connect with the Focus Series Function Tester, which supports a variety of tests. 【Features】 ■ Comprehensive pin testing ■ Ultra-fast testing ■ Uses semiconductor switches ■ Ultra-compact size ■ Windows PC control software ■ Connection with external devices ■ Programmable judgment values ■ Expandable in units of 128 pins ■ High potential for future expansion *For more details, please refer to the PDF document or feel free to contact us.
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【Other Features】 ■ Standard software for PC control included ■ Device operation via USB, allowing control of the main unit with an operation panel feel ■ Easy input and output of start/results from other devices connected to the sequencer ■ External printer also available ■ Utilizing technology gained from ICT, a newly developed hardware short/open test system enables even faster testing ■ By using semiconductor switches that do not have a lifespan for the MPX section, which repeatedly switches ON and OFF, maintenance costs are minimized ■ Does not apply stress to the measured substrate to prevent static electricity buildup ■ By having three threshold values based on the track record of short/open tests on mounted substrates, stable measurements are possible (these settings can be configured within 1Ω to 1KΩ) ■ Standard size supports 128 pins by default ■ Using an M-size case allows expansion up to 512 pins (For more than that number of pins, please consult us for support) *For more details, please refer to the PDF document or feel free to contact us.
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【Purpose】 ■ Semiconductor substrate inspection *For more details, please refer to the PDF document or feel free to contact us.
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