Wide contact area! Stage alignment can be achieved in a short time, improving measurement efficiency.
The "705A-WG7" is a manual prober for evaluation and analysis that can handle 12-inch wafers and FPD substrate defect analysis or TEG evaluation, thanks to its large stage. The adoption of a slide table ensures a wide probing area. Additionally, the air bearing stage allows for easy one-handed operation. Furthermore, it can be customized according to usage purposes, including the installation of various microscopes and laser cutter systems. 【Features】 ■ Compatible with large substrates ■ Supports defect analysis of 12-inch wafers and FPD substrates, as well as TEG evaluation ■ Ensures a wide probing area through the use of a slide table ■ Easy one-handed operation due to the air bearing stage ■ Equipped with a safety lock mechanism using a three-stage switching lever *For more details, please refer to the PDF document or feel free to contact us.
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【Other Features】 ■ Prevents damage to devices and probes caused by operational errors during contact ■ Customization is possible according to usage purposes, such as the incorporation of various microscopes and laser cutter systems *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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We are a company that develops, manufactures, and sells inspection equipment and tools for electronic components such as semiconductor inspection tools like probe cards, as well as inspection equipment for semiconductors and liquid crystal displays, utilizing electrical measurement technology, microfabrication technology, image processing technology, and more. With approximately 60% of our sales coming from overseas, we have seven overseas bases for production, sales, and services, and we operate in the global field of the expanding electronics industry.
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