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  6. Optical Coherence Tomography Imaging System【SS-OCT】

Optical Coherence Tomography Imaging System【SS-OCT】

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SS-OCT

last updated:Jun 22, 2022

システムズエンジニアリング
システムズエンジニアリング
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Probe-type OCT system using high-speed swept source

We provide the best system tailored to your needs through in-house design and manufacturing, along with customized equipment configuration and software development. 【Features】 ■ Utilizes near-infrared light, enabling non-contact high-speed measurements without the worry of X-ray exposure. ■ Eliminates the complexity of exposure countermeasures, source management, and the use of ultrasound gels. ■ Measurement depth: 5–10nm, resolution: 4–13μm (in the depth direction). ■ Positioning through real-time 2D image observation, seamlessly transitioning to 3D image measurement. Capable of capturing one volume in just a few seconds. ■ Center wavelengths can be selected from 1060nm, 1310nm, or 1550nm. Options available for MEMS type or VCSEL type.

    Laser microscopeOther microscopes
SS-OCT_220x220.png

Optical Coherence Tomography Imaging System【SS-OCT】

SS-OCT_220x220.png
SS-OCT_220x220.png

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Applications/Examples of results

【Applications】 - Resin products: Fusion state, welding process analysis - Industrial products (plastic, ceramic, pearl): Inspection of shape, thickness, foreign substances, and cracks. Analysis of deterioration. - Laser welding, metal surfaces: Shape observation (defect analysis), scratch inspection - Skin measurement: Observation of sweat glands, skin texture, analysis of moisture penetration history, etc. 【Custom Specifications Support】 - Production of probes tailored to sample shapes - Creation of measurement jigs, fiber lengths, and auxiliary units suited to the site - Development of individual software tailored to analysis We propose system configurations that align with your operations and provide counseling. *For more details, please feel free to contact us.

Detailed information

  • case_220x220.png

    Cross-sectional image of a tablet case

  • SS-OCT_02_220x220.png

    Tape fault image 1060nm: High-resolution model

  • SS-OCT_03_220x220.png

    Tape fault image 1310nm: High depth reach model

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High-resolution optical coherence tomography imaging device SS-OCT

High-resolution optical coherence tomography imaging device SS-OCT

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システムズエンジニアリング

システムズエンジニアリング

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Accurate analysis and evaluation are always important challenges for various research and development institutions. In systems engineering, we respond to these needs by utilizing our unique information network to procure excellent equipment, accessories, software, and more from around the world, while providing various support services to deliver them to you.

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