Case Studies of Preprocessing for Analysis and Observation of Ion Milling (CP)/Cryo
We will introduce various examples of ion milling processing, cryo-processing, and pre-treatment for cross-section processing, analysis, and observation.
In this case study collection, we will introduce examples related to "pre-treatment" in analysis and observation. We include numerous examples of pre-treatment for analysis and observation, covering objectives, methods, samples, and results, such as "Introduction to Ion Milling (CP Processing)," "Microsection Processing by Ion Milling," and "SEM Observation Pre-treatment Using Ionic Liquids." Additionally, we also present cross-sectional analysis of various materials, sample overviews, and cross-sectional observation results. We encourage you to read through it. [Contents] ■ Introduction to Ion Milling (CP Processing) ■ Microsection Processing by Ion Milling ■ SEM Observation Pre-treatment Using Ionic Liquids ■ Cooling (Cryo) Ion Milling Cross-section Processing Moreover, there is know-how involved in pre-treatment. Since there are examples not included in this collection, please feel free to contact us.
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【Details of the Publication (Excerpt)】 ■ Introduction to Ion Milling Method (CP Processing) - Analysis Examples ■ Micro Cross-Section Processing by Ion Milling - Purpose: To create a cross-section near the center of the wire for observation using the ion milling method - Method: Ion milling, FE-SEM - Sample: Processed at the wire bonding part of an IC chip - Results: Cross-section creation and observation possible at the center of the wire (25μm) *For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
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