Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.

We will conduct a multifaceted investigation of heating effects on plated components using AFM scanning probe microscopy and AES Auger electron spectroscopy.

The AFM scanning probe microscope is a device that detects various physical interactions occurring between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties. These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be conducted in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of whether they are conductive or insulating. The AES Auger electron spectrometer allows for elemental analysis of the extreme surface layer of materials (approximately 5nm) and investigation of concentration gradients in the depth direction. Using these two analytical devices, we conducted a study on the heating effects on the surface of plated connector contact pins. Please take a moment to read the PDF materials. Furthermore, in addition to these analytical devices, our company also conducts various surface analyses such as XPS and GD-OES. We would be happy to assist you, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.

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