Evaluation of the heating effects on plated parts using AFM/AES Auger electron spectroscopy.
We will conduct a multifaceted investigation of heating effects on plated components using AFM scanning probe microscopy and AES Auger electron spectroscopy.
The AFM scanning probe microscope is a device that detects various physical interactions occurring between the probe and the sample surface, allowing for the observation of surface shapes in minute areas and the measurement of electrical and mechanical properties. These physical interactions include atomic forces, frictional forces, and electrostatic forces. Additionally, measurements can be conducted in various environments, including atmospheric and vacuum conditions, enabling the observation of sample surfaces regardless of whether they are conductive or insulating. The AES Auger electron spectrometer allows for elemental analysis of the extreme surface layer of materials (approximately 5nm) and investigation of concentration gradients in the depth direction. Using these two analytical devices, we conducted a study on the heating effects on the surface of plated connector contact pins. Please take a moment to read the PDF materials. Furthermore, in addition to these analytical devices, our company also conducts various surface analyses such as XPS and GD-OES. We would be happy to assist you, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.
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basic information
● In an AFM scanning probe microscope, it is possible to capture and measure extremely small surface irregularities (surface morphology). ● In an AES Auger electron spectrometer, it is possible to analyze the elemental composition of the material's surface layer (approximately 5nm) and investigate concentration gradients in the depth direction. *For more details, please refer to the PDF document or feel free to contact us.*
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For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.