It is an inspection and adjustment system using a Shack-Hartmann wavefront sensor. It is suitable for introduction to production lines that require high takt time.
- It has a wide dynamic range and can measure large aberrations that are difficult to measure with an interferometer. - Real-time wavefront aberration measurement at 30Hz (max) is possible due to high-speed processing. - The light source for measurement can be customized according to customer requirements (multi-wavelength compatible). - It is less affected by vibrations and temperature, allowing for stable measurements even in production processes. - We can provide wavefront measurement software WFS2, designed with features and usability in mind for mass production processes.
Inquire About This Product
basic information
◇Measurement Items: Total Wavefront Aberration (PV, Rms), Zernike Polynomial Coefficients (up to 36 terms), Seidel Aberration Coefficients ◇Measurement Accuracy (Rms): Less than λ/100 (3σ) ◇Measurement Reproducibility (Rms): Less than λ/300 (3σ) ◇Effective Diameter of Test Lens Measurement: φ4 to 9.8mm *Can be changed with the expander option ◇Maximum NA of Test Lens Measurement: 0.85 ◇Measurement Light Source Wavelength: 635nm ± 10nm *Can be changed with the laser option Equipped Wavefront Sensor: High-speed Wavefront Sensor PWS-1000, 1-inch size *Can be changed to other models as well. Maximum Measurement Update Rate: 30Hz Measurement Aberration Range (Seidel Sa3): 3 50λ Coeff. Control and Analysis Software: Pulse Tech Industry's WFS2
Price range
Delivery Time
Applications/Examples of results
- Inspection of non-spherical lenses and uneven lenses - Adjustment of lens units and optical devices - Inspection of reflection and transmission wavefronts of flat surfaces
Company information
Pulse Tech Industries has aimed to be a "research and development-oriented manufacturing company" since its founding, engaging in numerous projects such as labor-saving devices and inspection equipment that are difficult to address with existing products, thereby contributing to the improvement of our customers' productivity and quality. The "portable X-ray residual stress measurement device" and "fluorescent detection head" are products developed in-house by combining the elemental technologies we have cultivated over the years, and they have received high praise from various sectors. We offer optimal solutions tailored to our customers' needs, including challenging issues, custom equipment, joint development, and engineer dispatch, so please feel free to contact us. Engineers responding to custom needs (special specifications): X-ray handling technology - 37 X-ray work supervisors Circuit design technology - 3 electrical equipment assembly technicians Optical design technology - 10 international optical engineers Mechanical design technology - 7 mechanical design engineers - 19 metal materials testing technicians - 3 3D CAD users Software development technology - 23 information technology specialists - 2 software quality technicians - 3 holders of LabVIEW certification
![Electromagnetic Thickness Probe 'Fe-20' for Film Thickness Gauge SWT [Rental]](https://image.mono.ipros.com/public/product/image/5de/2000486410/IPROS36775586995948668223.jpeg?w=280&h=280)
![High Concentration Measurement Cosmo Detector 'XP-334' [Rental]](https://image.mono.ipros.com/public/product/image/086/2000486093/IPROS45792363782775435122.jpeg?w=280&h=280)
![Portable Turbidity Meter 'TB-25A' [Rental]](https://image.mono.ipros.com/public/product/image/1c0/2000454618/IPROS10298209795844832170.jpeg?w=280&h=280)
![Foreign Matter Contamination Prevention Measures - Microparticle Visualization System [Web Demo in Progress]](https://image.mono.ipros.com/public/product/image/310/2001517192/IPROS356544541903119186.PNG?w=280&h=280)
