A measuring instrument capable of simultaneous measurement of transmittance and reflectance using a photodetector or OD meter.
As a custom specification, we can also accommodate devices for simultaneous measurement of transmittance and reflectance.
The 'DD8-N', which can display in real-time, is a measuring instrument capable of simultaneous measurement of transmittance and reflectance for absorbance meters and OD meters. It is suitable for inline measurement, making it ideal for production lines in factories. Customization to fit specific line requirements is available according to customer needs. 【Features】 ■ Measurement of ultra-weak light from 8OD to 12OD without the need for a darkroom ■ Ability to cancel external light and noise ■ Calculation of optical density from the transmittance of the sample relative to the reference ■ Continuous measurement at arbitrary intervals ■ Support for various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.
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【Measurement Items】 ■OD Value (OD): Absorbance (up to 12 OD can be measured as an option) ■Transmittance (%): Transmittance ■Reflectance* (%): Reflectance ■Transmittance at Specified Wavelength* (%): Transmittance at specified wavelength ■Reflectance at Specified Wavelength* (%): Reflectance at specified wavelength ■Film Thickness* (μm): Film thickness value *Measurement items that can be added as options. *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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From now on, it is expected that various technologies across a wide range of fields will be utilized in various places. To achieve this, we will strive to respond to various scenarios in the fields of research, development, and production. By integrating optics, electronics, mechatronics, and software, we aim to contribute to a wide range of research, development, and production fields centered around "lighting," "materials," and "pharmaceuticals."
