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  5. Analytical Equipment and Devices
  6. A measuring instrument suitable for inline measurement with a photodetector and OD meter! *Supports multiple channels.

A measuring instrument suitable for inline measurement with a photodetector and OD meter! *Supports multiple channels.

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last updated:Dec 27, 2022

システムロード
システムロード
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It is a measuring instrument that supports CH1 to CH12 and multiple channels. As a custom specification, it can also accommodate simultaneous measurement of 3 channels for inline measurement.

The "DD8-N" is a measurement device suitable for inline measurement with a spectrophotometer and OD meter, supporting CH1 to CH12 and multi-channel configurations. It can also accommodate custom specifications such as simultaneous 3-channel measurements for inline applications. It is capable of operating in the ultraviolet and near-infrared regions, allowing compatibility with various standards through support for different wavelengths. Additionally, it is available in custom specifications. 【Features】 ■ Measures ultra-weak light from 8OD to 12OD without the need for a darkroom ■ Can cancel external light and noise ■ Calculates optical density from the transmittance of the sample relative to the reference ■ Continuous measurement is possible at arbitrary intervals ■ Supports various options and custom specifications *For more details, please refer to the PDF materials or feel free to contact us.

    Analytical Equipment and Devices
DD8-N.jpg

A measuring instrument suitable for inline measurement with a photodetector and OD meter! *Supports multiple channels.

DD8-N.jpg
DD8-N.jpg
  • Related Link - https://systemroad.co.jp/products/spectrometry.htm…

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basic information

【Measurement Items】 ■OD Value (OD): Absorbance (up to 12 OD can be measured as an option) ■Transmittance (%): Transmittance ■Reflectance* (%): Reflectance ■Transmittance at Specified Wavelength* (%): Transmittance at specified wavelength ■Reflectance at Specified Wavelength* (%): Reflectance at specified wavelength ■Film Thickness* (μm): Film thickness value *Measurement items that can be added as options. *For more details, please refer to the PDF document or feel free to contact us.

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Absorbance measurement system "DD8-N"

Absorbance measurement system "DD8-N"

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DD8-N Absorbance Measurement System

DD8-N Absorbance Measurement System

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システムロード

システムロード

Testing, Analysis and Measurement

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From now on, it is expected that various technologies across a wide range of fields will be utilized in various places. To achieve this, we will strive to respond to various scenarios in the fields of research, development, and production. By integrating optics, electronics, mechatronics, and software, we aim to contribute to a wide range of research, development, and production fields centered around "lighting," "materials," and "pharmaceuticals."

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