Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.
The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess damage to the passivation layer around laser contact holes. Additionally, defect location identification is possible through EL observation of modules using a DC power supply.
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basic information
Product Features 1. Silicon wafers (6 inches square or smaller) 2. Ultra-high sensitivity cooled CCD camera (1 million pixels, -70°C) 3. Bulk imaging measurement within the field of view enabled by a planar laser light source 4. Equipped with high-function image processing software 5. Integrated dedicated high-shielding dark box
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Applications/Examples of results
We can conduct a demo using customer samples. We also accept customization based on individual requests. Please feel free to contact us here.
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
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