Multi-Probe System (Dedicated Option for APT-2600FD)

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning." We are pleased to announce that a report on this research will be displayed and introduced at the Ehime University booth during the JPCA Show 2024 / 2024 Microelectronics Show, which will be held from June 12 (Wednesday) to June 14 (Friday) at Tokyo Big Sight. Additionally, a seminar presentation related to this topic will take place on June 14 (Friday) at the venue. Takaya will also be exhibiting at the same exhibition, showcasing a real flying probe tester. We hope that all attendees will visit the booth and seminar venue. *Ehime University Booth Booth Number: 3B-56 (Academic Plaza) *Seminar Date and Time: June 14 (Friday) 13:20-13:40 Venue: Seminar Room E Session: 3DMID Seminar / Academic Plaza *Takaya Corporation Booth Booth Number: 4C-38 (Hall 4 East)

The 38th Electronics Packaging Conference was held from March 13 (Wednesday) to 15 (Friday), 2024, at the Noda Campus of Tokyo University of Science. At this conference, Mr. Yanagida, the Technical Department Manager of Takaya Corporation's Industrial Equipment Division, gave a presentation on "The Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers." The presentation materials from that event have been made available, so please take a look at the related catalog page below. -------- Content -------- To ensure reliable assembly guarantees for printed circuit boards, electrical testing is essential. However, a single testing method alone cannot achieve sufficient test coverage. To address this issue, we introduce a hybrid testing system that integrates flying probe testers and JTAG boundary scan testing. By complementing each testing method, we can maximize the test coverage for high-density printed circuit boards, enabling more accurate fault diagnosis.

We would like to express our sincere gratitude for your continued support. We are pleased to announce that we will be exhibiting at the "Total Solution Exhibition for Electronic Devices 2024 / JISSO PROTEC 2024," which will be held at Tokyo Big Sight from June 12 to June 14, 2024. We will showcase our in-circuit tester (ICT) "APT-1600FD-A," which enables simultaneous contact testing on both the top and bottom surfaces of printed circuit boards using a maximum of six probes in combination with the simultaneous use of upper and lower flying probes. On the day of the event, we will conduct a demonstration of continuous automatic testing in conjunction with front and rear devices (loader/unloader). Our booth at Takaya Corporation will be located at East Hall 4, 4C-38. This exhibition requires "WEB registration." Please register online in advance. We sincerely look forward to your visit.

Takaya Corporation exhibited a variety of products and services in collaboration with the Industrial Equipment Division, RF Division, and Solutions Division at the "38th Nepcon Japan," held at Tokyo Big Sight from January 24 to 26. 【Exhibits from the Industrial Equipment Division】 - Flagship model "APT-1600FD-A" with unmanned continuous dual-side inspection linked to front and rear devices. - A system that uses OPC-UA (OPC Unified Architecture) to connect the tester with the customer's MES (Manufacturing Execution System) for real-time management of operational status. If you have any questions or inquiries regarding the exhibits, please feel free to contact us. --- 38th Nepcon Japan - Electronics Development and Implementation Exhibition 【Dates】January 24 (Wednesday) to January 26 (Friday), 2024 【Hours】10:00 AM to 5:00 PM 【Venue】Tokyo Big Sight 【Organizer】RX Japan Ltd.