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  6. Analysis of trace metal elements in liquid crystals

Analysis of trace metal elements in liquid crystals

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last updated:Jun 26, 2025

アイテス
アイテス
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Depending on the panel size, it is possible to analyze using different ICP-AES/MS devices!

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, along with quantification. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal does not operate correctly, leading to display defects. Ionic substances are known to increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES and ICP-MS are used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis *For more details, please refer to the PDF document or feel free to contact us.

    Analysis Services
panel_ICP_1.png

Analysis of trace metal elements in liquid crystals

panel_ICP_1.png
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Total solution for the reliability of LCD displays.

Total solution for the reliability of LCD displays.

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[Information] Liquid Crystal Materials and Their Analytical Techniques

[Information] Liquid Crystal Materials and Their Analytical Techniques

OTHER
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GCMS analysis of liquid crystal components

GCMS analysis of liquid crystal components

TECHNICAL
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LCD panel quality analysis

LCD panel quality analysis

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Defective analysis of liquid crystal panels

Defective analysis of liquid crystal panels

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[Data] ICP Emission Spectroscopy (ICP-AES)

[Data] ICP Emission Spectroscopy (ICP-AES)

OTHER
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[Data] Analysis of SEG-LCD Panel Display Malfunction

[Data] Analysis of SEG-LCD Panel Display Malfunction

OTHER
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Evaluation of TFT characteristics of liquid crystal panels

Evaluation of TFT characteristics of liquid crystal panels

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Liquid Crystal Material Analysis

Liquid Crystal Material Analysis

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Analysis of Liquid Crystal Display Materials

Analysis of Liquid Crystal Display Materials

TECHNICAL
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Analysis of trace metal elements in liquid crystals

Analysis of trace metal elements in liquid crystals

TECHNICAL
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Analysis of defects in overseas manufactured displays

Analysis of defects in overseas manufactured displays

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Analysis of good quality overseas manufactured LCD displays

Analysis of good quality overseas manufactured LCD displays

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Chemical Analysis Trust Service

Chemical Analysis Trust Service

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Chemical Analysis Concierge Service

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We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.

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Analysis of trace metal elements in liquid crystals

  • Product news

We will introduce a case where ICP measurement was conducted using panels before and after reliability testing, along with quantification. The liquid crystal molecules in an LCD are oriented within the panel, and the display is controlled by changes in the orientation state of the liquid crystal due to voltage. When ionic substances, such as metal elements, are present inside the panel, the liquid crystal may not drive correctly, leading to display defects. It is known that ionic substances can increase due to contamination during manufacturing or long-term use, making it important to quantify and understand them as part of panel quality. Metal ions can be quantitatively analyzed using ICP analysis, and depending on the differences in pretreatment methods and detection sensitivity, ICP-AES and ICP-MS are used selectively. [Analysis Content] ■ Comparison of metal element content using ICP-AES analysis ■ Comparison of metal element content using ICP-MS analysis For more details, please refer to the related products and catalog below.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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