It is a device that measures the dynamic characteristics of semiconductors according to specified test conditions.
The "ST-2400" is a device designed for safely and efficiently conducting research and development, reliability testing, and destructive testing as a dynamic tester for power devices. It allows for the setting of up to 10 waveform analysis conditions with a single pulse application, enabling a reduction in evaluation time. The program for conducting tests requires only the input of necessary parameters for the condition items, making it easy to operate. Additionally, test results are saved in measurement data (CSV format) and waveform data (CSV format and JPG format), allowing for the creation of graphs and tables using commercial software (such as Excel). 【Features】 ■ Easy management of measurement data and waveform data ■ Top-class dynamic characteristic testing for power devices ■ Suitable for shortening product development time for power devices *For more details, please download the PDF or feel free to contact us.
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**Features** - Standard equipped with necessary test items for power devices: - L-load switching measurement, R-load switching measurement, recovery voltage (Trr), unclamped avalanche measurement, Scsoa, Rbsoa, Ies current measurement, Qg (gate charge) measurement - Various device measurements can be performed by exchanging measurement jigs - Trip current settings include IcTrip setting and T1Trip setting - If the current exceeds the IcMax setting value, it will immediately cut off to protect the DUT and the tester - Ices measurement is possible before and after power application, allowing for the assessment of device damage due to power application - The software includes "Operator Mode" and "Technician Mode," with password protection for condition files, etc. *For more details, please download the PDF or feel free to contact us.*
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We are a tester manufacturer specializing in semiconductors and electronic components, focusing on power devices used in hybrid vehicles and energy-saving appliances. We respond to various customer needs, from evaluation and testing during product development stages to front-end testing at the wafer and chip levels, and back-end testing after packaging, providing comfortable solution activities. Please feel free to contact us if you have any requests.