Multiple different measurement item conditions can be set, allowing for continuous testing.
The ST-6527B is a device that measures the dynamic characteristics of semiconductors according to set test conditions. All test items are analyzed by capturing waveforms with a digital oscilloscope for measurement and judgment. It is equipped with a variety of analysis functions, including single tests, sweep tests, and loop tests. Additionally, L load, R load, snubber capacitors, diodes, and gate resistors use a plug-in type, allowing for various hardware configurations. 【Features】 - Easy management of measurement data and waveform data - Specialized for dynamic characteristic testing of power devices - Capable of testing at high temperatures (up to 230°C) *For more details, please download the PDF or feel free to contact us.
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【Electrical Specifications】 ■ Collector Driver ・ Maximum output voltage Vce: 1700V ・ Maximum output voltage Vclamp: 2000V ■ Measurement Load ・ L load: 6 types ・ R load: 5 types ■ Gate Driver Power Supply, Gate Driver, Rg ・ Discharge time: 5ms/under 15V ・ Driver output peak current: 4A, etc. * For more details, please download the PDF or feel free to contact us.
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We are a tester manufacturer specializing in semiconductors and electronic components, focusing on power devices used in hybrid vehicles and energy-saving appliances. We respond to various customer needs, from evaluation and testing during product development stages to front-end testing at the wafer and chip levels, and back-end testing after packaging, providing comfortable solution activities. Please feel free to contact us if you have any requests.
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