300mm wafer-compatible automatic contact angle meter
The stage fixture uses PEEK. Compatible with small-diameter wafers. Equipped with a high-quality 5-megapixel megapixel zoom lens. Traceable calibration support, made in Japan. Windows 11 PC sold separately.
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basic information
Model: Simage AUTO 300 wafer Target sample size: axφ300mm Measurement range: 0 < θ < 180 ° Angle resolution: 0.1° Contact angle analysis method: Tangent method (Auto mode) θ/2 method (Manual mode) Expansion and contraction method Industrial standards: ASTM D724, D5725, D5946, ISO 15989 ISO documents (optional): Calibration certificate, inspection report, traceability diagram Operating range: X, Z stage Camera optical system: 5 million pixel camera, megapixel zoom lens Supported OS: Windows 11, 10 *PC sold separately Time-lapse measurement: Approximately 15fps *Dependent on PC performance Stage work holder: PEEK holder Standard dispenser: 2.5-10μL Micrometer head control Power supply: AC100V 50/60Hz 2W Accessories: Contact angle analysis software, USB dongle, instruction manual, inspection report Options: Auto dispenser, various syringe needles Surface free energy analysis software, etc. Standard price (excluding tax and shipping): ask
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Applications/Examples of results
Contact angle measurement of semiconductor wafers - Compatible with small-diameter wafers.
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Company information
Our company, based on years of experience and a wealth of achievements, supplies the latest excimer surface treatment to various needs of businesses, research institutions, and universities as an excimer UV application technology manufacturer. We are a specialized manufacturer that designs and produces according to specifications and budgets from the user's perspective. Please consult us regarding excimer UV cleaning surface modification treatment and contact angle meters for surface evaluation.
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