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  6. Micro FT-IR

Micro FT-IR

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last updated:Jun 26, 2025

アイテス
アイテス
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This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.

There are three main measurement methods for "microscopic FT-IR": "transmission method," "reflection method," and "ATR method." In "microscopic FT-IR," which combines FT-IR with an optical microscope, it is possible to measure small substances on the order of several tens of micrometers that are difficult to measure with conventional FT-IR, using an aperture (field stop). While the transmission method is the basic measurement method in microscopic FT-IR measurements, the reflection method or ATR method may be more suitable depending on the shape of the sample and the feasibility of sampling. 【Characteristics of Measurement Methods】 ■ Transmission Method - Infrared light is irradiated onto the sample, and the transmitted light is measured. - Information is obtained from the thickness of the material that the infrared light has passed through. ■ Reflection Method - Infrared light is irradiated onto the sample, and the reflected light is measured. - Information is obtained from the surface of the sample. *For more details, please download the PDF or feel free to contact us.

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顕微FT-IR.jpg

Micro FT-IR

顕微FT-IR.jpg
顕微FT-IR.jpg
  • Related Link - https://www.ites.co.jp/chemistry/index/minute-fore…
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【Features of Other Measurement Methods】 ■ATR Method - Infrared light is irradiated onto the sample through a crystal, and the light that slightly penetrates the sample at the crystal interface is measured. - Information from a sample surface layer of about a few micrometers is obtained. *For more details, please download the PDF or feel free to contact us.

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catalog(8)

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Liquid foreign substance sampling technique for FT-IR analysis

Liquid foreign substance sampling technique for FT-IR analysis

TECHNICAL
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[Data] FT-IR Analysis of Transparent Resin

[Data] FT-IR Analysis of Transparent Resin

TECHNICAL
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[Data] IR Analysis of Vinyl Polymers (Resin Materials)

[Data] IR Analysis of Vinyl Polymers (Resin Materials)

TECHNICAL
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FT-IR analysis of ABS resin

FT-IR analysis of ABS resin

TECHNICAL
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Comparison of Infrared Spectroscopy and Raman Spectroscopy

Comparison of Infrared Spectroscopy and Raman Spectroscopy

OTHER
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Micro FT-IR

Micro FT-IR

TECHNICAL
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Analysis of organic-inorganic composites using FT-IR and EDX.

Analysis of organic-inorganic composites using FT-IR and EDX.

OTHER
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Component analysis of organic matter (FT-IR and GC/MS)

Component analysis of organic matter (FT-IR and GC/MS)

OTHER
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Analysis of organic-inorganic composite materials using FT-IR and EDX.

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We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.

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Introduction to Micro FT-IR

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At Aites Co., Ltd., we have newly introduced "Microscopic FT-IR" this fiscal year. The "Microscopic FT-IR," which combines FT-IR and optical microscopy, allows for the measurement of tiny substances on the order of several tens of micrometers, which are difficult to measure with conventional FT-IR, using an aperture (field of view diaphragm). There are three main measurement methods for Microscopic FT-IR: "transmission method," "reflection method," and "ATR method." While the transmission method is the basic measurement method in Microscopic FT-IR measurements, the reflection method or ATR method may be more suitable depending on the shape of the sample and the feasibility of sampling.

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アイテス

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Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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