Equipped with a multi-wavelength laser, it can handle everything from visible light to near-infrared light with a single device.
PHEMOS-X is a high-resolution emission microscope that captures light emission and heat generation caused by semiconductor device failures to identify the failure location. 1. Capable of mounting up to two ultra-high sensitivity cameras. 2. Can accommodate up to seven light sources for OBIRCH, DALS, EOP, and laser markers. 3. Equipped with an optical stage compatible with various samples.
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basic information
By covering different detection ranges such as luminescence analysis and heat generation analysis, or visible light and near-infrared light, you can select analysis techniques tailored to the sample or failure mode.
Price range
P9
Delivery Time
Applications/Examples of results
It is used for the analysis of semiconductors.
Company information
Our company values human resources and has practiced sound management as the foundation of our customers' trust, leading to our growth. We cherish the connections between people and have decided to continue existing as a company recognized by our customers for our significance. The world is changing, and at a considerable speed. We are considering letting go of our past successes. Following traditional methods will not create any new value. We will focus our efforts on things that others do not or cannot do, investing all our energy and resources into this. Even if we are small, we aim to become a company that earns greater trust and inspires our customers.
![[Analysis Case] Investigation of Defective Bipolar Transistors (IGBT)](https://image.mono.ipros.com/public/product/image/d17/2000026094/IPROS1716188955532766691.jpg?w=280&h=280)
![[EMS] Emission Microscopy Method](https://image.mono.ipros.com/public/product/image/ebd/387108012/IPROS78188100613521420358.jpeg?w=280&h=280)