Connection to coupling pliers or three-phase coupling networks via high voltage output!
We would like to introduce our EMC testing equipment, the 'SFT1400'. It simulates burst noise for EFT testing as defined by the IEC 61000-4-4 and DIN EN 61000-4-4 standards. With a very short rise time of 5ns, each pulse can generate a wideband RF spectrum of up to 300MHz. 【Features】 ■ Generation of wideband RF spectrum ■ Simple operation ■ Color touch display ■ Parameters can be changed during testing ■ Memory function *For more details, please refer to the related links or feel free to contact us.
Inquire About This Product
basic information
【Other Features】 ■ Saving test sequences ■ Special functions such as real burst and noise ■ Equipped with optical interface ■ Compatible with a wide range of accessories *For more details, please refer to the related links or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the related links or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Manufacturing and sales of related items such as radio wave equipment (shielded rooms, anechoic chambers, shielded boxes), materials (radio wave absorbers, shielding materials), azimuth tables, software for radio wave measurement, measurement system construction, measurement antennas, high-frequency cables, and shielded boxes for wireless LAN. Recently, microwave components and millimeter-wave components have also become available from the United States, Europe, and Southeast Asia. We strive to provide low-cost, high-performance products with short delivery times, comparable to those in Japan. Additionally, we assemble custom RF products in response to user requests. For any inquiries regarding RF microwave and millimeter-wave products, please feel free to contact us, and we will do our best to assist you. We aim to respond to inquiries within two days. Furthermore, we provide regular updates to users regarding delivery times based on shipping status and conditions.
