By measuring the energy and intensity of photoelectrons, it is possible to identify and quantify atoms!
"X-ray photoelectron spectroscopy (XPS)" is a surface analysis technique that allows for the compositional analysis of ultra-thin surfaces at the nanometer level. It is also capable of evaluating the electronic states (chemical bonding, valence, hybridization, electron correlation) of each element that makes up the material, and by using a neutralization gun, it can measure the surfaces of insulators as well, making it widely used for the analysis of various material surfaces. Please feel free to contact us when you need assistance. 【Features】 ■ Compositional analysis of the topmost surface at the nanometer level (Li and above) is possible ■ Sensitivity is approximately 0.1 atomic% ■ Electronic state analysis (chemical bonding, valence, gap, etc.) is possible ■ Measurement of insulators and organic materials is possible (non-destructive analysis) ■ Measurement area ranges from several tens to several hundred µm in diameter * For more details, please download the PDF or feel free to contact us.
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【Applications】 ■ Evaluation of ultra-thin films and surface (composition, impurities, contamination, condition) ■ Investigation of discoloration causes (contamination, deterioration, surface oxidation) ■ Investigation of causes of bonding and adhesion failures (surface contamination, deterioration, diffusion) ■ Interface condition (depth direction analysis) *For more details, please download the PDF or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.