Thin Film X-ray Diffraction (XRD)

It is possible to evaluate the crystallinity of thin films using In-Plane XRD and measure the physical properties of thin films using XRR!

We would like to introduce our "Thin Film X-ray Diffraction (XRD)." In addition to identifying the crystal structure of thin films at the nanometer level, we can also analyze the film density, thickness, and roughness of multilayer films through X-ray reflectivity measurements. By incidenting X-rays with good parallelism at a very shallow angle to the sample, we can achieve an extremely shallow penetration depth of the X-rays, allowing for the evaluation of thin film crystallinity using In-Plane XRD and the measurement of thin film physical properties using XRR. 【Features】 ■ In-Plane XRD (In-Plane Rotation Measurement) Evaluation of crystalline thin films at the nanometer level ■ XRR (X-ray Reflectivity Measurement) Evaluation of film density, thickness, and (surface/interface) roughness ■ Support for general thin film methods (fixed θ 2θ scanning) *For more details, please download the PDF or feel free to contact us.

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