Improved resolution for TEM and STEM! Performance significantly enhanced with the capability for EDS analysis using four detectors.
Our company will introduce the FEI "Talos F200E" transmission electron microscope system. Compared to conventional models, the resolution for TEM and STEM has improved, and performance has been significantly enhanced, allowing for EDS analysis with four detectors. Additionally, it is equipped with Drift Corrected Frame Integration (DCFI), which accumulates multiple frames while correcting for drift. 【Specifications (excerpt)】 ■ Acceleration voltage: 200kV, 80kV ■ TEM information limit: ≦0.11nm ■ STEM resolution: ≦0.14nm ■ Drift Corrected Frame Integration (DCFI) ・ Accumulates multiple frames while correcting for drift * For more details, please download the PDF or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
