[Analysis Case] Evaluation of DC Voltage Dependence of Carriers in Semiconductors
We will introduce an analysis case using Si samples with known carrier concentration!
Our organization offers evaluation of the direct current voltage dependence of carriers in semiconductors. SMM measurement is a technique that can map the concentration of carriers in semiconductors. Additionally, it is possible to apply a direct current voltage to the sample during SMM measurement to induce carriers while measuring. Mapping measurements are conducted while acquiring SMM signals under different applied voltage conditions at each measurement point, constructing a data cube. After collecting all data, analyzing the SMM signals according to the applied voltage conditions allows us to visualize the behavior of carriers in response to the applied voltage. [Measurement Method / Processing Method] ■ [SMM] Scanning Microwave Microscope Method *For more details, please download the PDF or feel free to contact us.
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basic information
【Product Fields】 ■LSI・Memory ■Power Devices ■Optical Devices ■Solar Cells ■Lighting ■Oxide Semiconductors *For more details, please download the PDF or feel free to contact us.
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【Analysis Objectives】 ■Shape Evaluation ■Product Research *For more details, please download the PDF or feel free to contact us.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!