Telecentric lens that can switch between surface inspection and transmission inspection.
VS-TCM1-65CO/S-RIR
It corrects focus shift within the wavelength range from visible light to 1200nm, allowing for switching between surface inspection and transmission inspection simply by changing the illumination wavelength.
Capable of imaging from visible light to 1200nm without focus shift. What is SWIR? It visualizes "invisible things." It can penetrate specific materials such as silicon and resin, making it applicable for various inspections. With the VS-TCM1-65CO/S-RIR, different inspections can be performed simply by changing the illumination wavelength. Additionally, imaging can be done while maintaining focus even when the wavelength is changed. Drawings can be downloaded by registering on our company website.
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basic information
MTF [at 30%] (lp/mm: unit of resolution) Center: 90 lp/mm Periphery: 80 lp/mm (image height 70%) Optical Magnification: 1.0x WD (mm): 65 NA: 0.067 Coaxial Illumination: Built-in Mount: C-Mount
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Applications/Examples of results
Wafers pattern: Clear visualization with focus shift correction even when changing the illumination wavelength.
Line up（1）
| Model number | overview |
|---|---|
| VS-TCM1-65CO/S-RIR | Optical magnification 1.0x |
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Company information
Clearly see what you want. Accurately measure and distinguish. VS Technology Co., Ltd. has over 25 years of experience in the lens business, and with our own lighting added, we propose [advanced solutions] that combine lenses and lighting. You can capture what you want to see more stably and with greater precision. We also offer solutions for image processing. By integrating lenses, lighting, and image processing, your "what you want to see" becomes "even more visible."
