Support from package level to wafer level.
High-precision voltage and current application, as well as the electrical characteristics and continuous changes of individual FET transistors, can be measured, allowing for centralized management of data collection and monitoring on a single PC.
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basic information
■AMM-C (Package Level) - Temperature Control: Constant temperature chamber (Espec small environmental test chamber SU-662) temperature control range: -60 to +150°C - Connection to DUT: DUT board (6 sockets) DIP600mil 28pin, DIP300mil 16pin selectable ■AMM-W (Wafer Level) - Temperature Control: Full/semi-auto/manual prober (please consult for manufacturer) - Connection to DUT: Positioner probe card (for high temperature and low current) *Suggestions will be made based on layout ≪Common Specifications≫ - Measurement Program: FET single transistor measurement library, 48 types - SMU Performance: Voltage ±50V / Current ±100mA
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Company information
Espec's environmental creation technology enables the reproduction of various Earth environments. This technology confirms the safety and reliability of various products, technologies, and services that support our daily lives. We offer a range of products, from compact sizes that can fit on a desk to large constant temperature and humidity chambers, as well as cold and heat shock devices for testing the reliability of electronic components. Our company provides comprehensive solutions for environmental testing, starting with proposals for customers' testing plans, selection and provision of testing equipment, and contracted environmental testing and analysis/evaluation. Furthermore, we offer various services, including product maintenance, rental of products, and sales of used products.
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