Simultaneous measurement of spring pressure and electrical characteristics with high precision.
This is a testing machine used to measure the quality and performance of "contact probes" used in semiconductor inspection. It is capable of simultaneously measuring the "spring pressure" and "electrical characteristics" across the entire range of the usage stroke.
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basic information
Load resolution: 0.1 mN (when selecting a 10 N load cell) Length resolution: 0.001 mm (maximum) Test speed: 0.001 mm/min to 10000 mm/min *The following configuration is included. For details, please check the related links (our company website) catalog or feel free to contact us.* ● Load testing machine MAX-1KN ● XY stage ● Resistance meter ● Microscope ● PC software 'AXR'
Price range
Delivery Time
Applications/Examples of results
Contact probe inspection
Detailed information
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Measuring
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Enlargement of the test specimen
Company information
Everything that exists in the world is influenced by force (power). As indicated by our company name, Japan Measurement Systems Co., Ltd. provides systems that measure the forces acting on objects. We accurately understand our customers' needs and consistently carry out design, development, manufacturing, calibration, and after-sales maintenance. "Research and development" and "quality control" have supported the advancement of manufacturing in Japan. In the essential field of measurement, particularly in force measurement, we always stand from our customers' perspective and will continue to contribute to manufacturing by providing new value to our customers with our motto of "high precision and user-friendly testing machines."



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