The M396CLP-16DK/M396CLP-17DK is a vertical portable spectrophotometer suitable for color measurement of small samples and curved surfaces.
It features a grip shape that fits comfortably in the hand and an easy-to-read operation screen, designed for user-friendliness even when measuring with one hand. It supports automatic switching between SCI (including specular reflection) and SCE (specular reflection removal), making it useful for color management of various materials. The M396CLP-17DK accommodates measurement diameter switching between φ8mm and φ3mm, and it is equipped with an electronic viewfinder, allowing measurements to be taken while confirming the position even in small measurement areas.
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■Common Specifications Model Number: M396CLP-16DK, M396CLP-17DK Illumination Receiving Optical System: di:8°, de:8° (diffuse illumination, 8° direction receiving), with automatic switching mechanism for SCI (including specular reflection) / SCE (specular reflection removed) Illumination Receiving Optical System Applicable Standards: Compliant with ISO7724/1, CIE No.15 (2004), ASTM E1164 (SCI), DIN 5033 Part 7, JIS Z 8722 Condition c Integrating Sphere Size: Φ40 mm Receiving Element: Dual 32-element silicon photodiode array Spectral Means: Plane diffraction grating Measurement Wavelength Range: 400 nm to 700 nm Measurement Wavelength Interval: 10 nm Half-Width: Approximately 10 nm Reflectance Measurement Range: 0 to 175%, Display Resolution: 0.01% Measurement Light Source: Pulse xenon lamp (with UV cut filter) Measurement Time: Approximately 0.7 seconds (time from pressing the measurement button to completion when measured in SCI or SCE) Minimum Measurement Interval: Approximately 1.5 seconds (when measured in SCI or SCE) Number of Possible Measurements: Approximately 2,000 times
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●Selectable measurement diameters according to application The M396CLP-16DK supports a measurement diameter of φ8mm. The M396CLP-17DK supports two sizes, φ8mm and φ3mm, allowing for changes in measurement diameter through target mask replacement and lens position switching. This enables measurements tailored to small parts or narrow measurement areas. ●Confirm measurement position with electronic viewfinder〈M396CLP-17DK〉 The M396CLP-17DK is equipped with an electronic viewfinder. You can check sample images on the main unit's LCD screen, which supports alignment to the desired measurement position. *The M396CLP-16DK does not have an electronic viewfinder. ●Fast measurement in approximately 0.7 seconds The measurement time for SCI or SCE is about 0.7 seconds, with the shortest possible measurement interval being approximately 1.5 seconds. This allows for efficient continuous color measurement work. ●Equipped with "WAA" for automatic wavelength deviation diagnosis and correction The device features Konica Minolta's unique automatic wavelength diagnosis and correction function, "WAA (Wavelength Analysis & Adjustment)." It automatically detects and corrects wavelength deviations in the measuring instrument, supporting stable color management.
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