PN Tester 【PN-50α】
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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basic information
【Non-contact PN Tester that can instantly determine by simply bringing it close to the sensor】 ◆ Determination method: Photoelectric method using light pulse irradiation ◆ Non-contact method, so it does not damage silicon wafers ◆ Can also determine wafers with an oxide film on the surface ◆ Instant determination possible due to light pulse irradiation ◆ Resistivity range for PN determination: 0.1 to 1,000 Ω/cm (However, this depends on the surface condition of the wafer) ◆ Can be integrated and used with automatic wafer transport systems (PN-80α) ● Target wafer sizes: Compatible from 2 inches to 12 inches (approximately 3mm thick) (*For other details, please contact us.)
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Applications/Examples of results
Silicon wafers (wrapped, etched, polished, mirror, bulk)
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.