PN Tester 【PN-12α】
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
Inquire About This Product
basic information
【Contact-type PN Tester Capable of Measurement Across a Wide Resistance Range】 ◆ Detection Method: Thermoelectric Method (Hot & Cold Probe) ◆ Detection is possible simply by placing the pen-shaped probe ◆ Compatible with most samples (silicon wafers, bulk, ingots) (Detection is not possible for samples with oxidized surfaces) ◆ Standard equipped with thermometer and analog meter ◆ Can be integrated into automatic wafer transport systems (PN-12β) ● Supported Wafer Sizes: From 2 inches to 12 inches (*) For more details, please contact us.
Price information
-
Delivery Time
Applications/Examples of results
Silicon wafers [wrapped, etched, polished, mirror], bulk, ingot (samples with oxidized surfaces cannot be assessed)
catalog（1）
Download All Catalogs
Company information
We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.
