PN Tester 【PN-12α】
Napson Co., Ltd. develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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basic information
【Contact-type PN Tester Capable of Measurement Across a Wide Resistance Range】 ◆ Detection Method: Thermoelectric Method (Hot & Cold Probe) ◆ Detection is possible simply by placing the pen-shaped probe ◆ Compatible with most samples (silicon wafers, bulk, ingots) (Detection is not possible for samples with oxidized surfaces) ◆ Standard equipped with thermometer and analog meter ◆ Can be integrated into automatic wafer transport systems (PN-12β) ● Supported Wafer Sizes: From 2 inches to 12 inches (*) For more details, please contact us.
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Applications/Examples of results
Silicon wafers [wrapped, etched, polished, mirror], bulk, ingot (samples with oxidized surfaces cannot be assessed)
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.