FPD Sheet Resistance Meter [NC-50/RG-1200S]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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basic information
Measurement stage for glass substrates with angled placement, considering operability ◆ Self-test function, measurement position correction, wide measurement range ◆ Measurement patterns can be set arbitrarily with a resolution of 0.1mm ◆ Sheet resistance and film thickness display function ◆ CIM communication, 2-D/3-D mapping software ■ There is also a 4-probe measurement type (RT-3000/RG-1200S). ● Target glass substrate size: 680mm×880mm to 2,200mm×2,500mm (planning for up to 2,880mm×3,080mm) (*) For other details, please contact us.
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Applications/Examples of results
ITO films for TFT, EL (OLED), CF, various metal films, n+a-Si films, etc.
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Company information
We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.