Non-contact wafer sorting system [NC-3000R]
Napson Corporation develops, manufactures, and sells various measurement systems for semiconductor wafers and FPD substrates. We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare. We have other products available, so please contact us for more details.
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Non-contact Wafer Sorting System Using Robot Conveyance ◆ Measurement of silicon wafer resistance, thickness, and P/N type using non-contact sensors ◆ Standard number of cassettes: 7 (total for loader/unloader, number of each cassette can be set as desired) ● Target wafer size: 12 inches (or 6 inches & 8 inches)
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Silicon wafer
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.